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Cover Picture: Texture Evolution During Bending of a Single Crystal Copper Nanowire Studied by EBSD and Crystal Plasticity Finite Element Simulations (Adv. Eng. Mater. 8/2008)
Author(s) -
Weber F.,
Schestakow I.,
Roters F.,
Raabe D.
Publication year - 2008
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200890020
Subject(s) - materials science , bent molecular geometry , electron backscatter diffraction , nanowire , crystal plasticity , finite element method , dislocation , bending , plasticity , single crystal , texture (cosmology) , diffraction , crystal (programming language) , crystallography , condensed matter physics , composite material , optics , microstructure , structural engineering , nanotechnology , physics , image (mathematics) , programming language , chemistry , artificial intelligence , computer science , engineering
Abstract The cover shows a bending test on a Cu single crystal nanowire. The distribution of the geometrically necessry dislocations in the bent wire was determined using high resolution electron back scatter diffraction and predicted using a crystal plasticity finite element method which uses a dislocation based constitutive law. More details can be found in the article of F. Weber, I. Schestakow, F. Roters, D. Raabe on page 737.