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Microstructure Characterisation of Electrical Discharge Craters using FIB/SEM Dual Beam Techniques
Author(s) -
Jeanvoine N.,
Holzapfel C.,
Soldera F.,
Mücklich F.
Publication year - 2008
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200800108
Subject(s) - materials science , impact crater , focused ion beam , microstructure , scanning electron microscope , composite material , ion , astrobiology , physics , quantum mechanics
This paper presents the characterisation of erosion craters caused by high voltage ignition discharges on the surface of electrodes. By means of FIB/SEM dual beam techniques such as FIB‐cross sectioning, FIB‐nanotomography and FIB‐EBSD, the microstructure modification below the crater surface is investigated, providing new insights into erosion crater phenomena. It demonstrates also that the use of FIB/SEM is ideally suited for assessing the microstructural nature of sub‐micron surface degradation features.