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Nano‐characterization of Cast Structures by FIB‐Tomography
Author(s) -
Lasagni F.,
Lasagni A.,
Engstler M.,
Degischer H. P.,
Mücklich F.
Publication year - 2008
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200700249
Subject(s) - focused ion beam , materials science , characterization (materials science) , scanning electron microscope , energy dispersive x ray spectroscopy , nano , nanotechnology , tomography , electron tomography , spectroscopy , microscopy , ion , optics , composite material , scanning transmission electron microscopy , chemistry , physics , quantum mechanics , organic chemistry
In this communication, the three dimensional architectures of different Al‐Si‐(Mg) alloys are analyzed using SEM (Scanning Electron Microscopy)/FIB (Focus Ion Beam), EDS (Energy Dispersive Spectroscopy)/FIB and SEM‐EDS/FIB tomographic methods. Several aspects for the imaging and quantification of the results are discussed describing the advantages and limitations of the methods to resolve submicron structures.