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Cover Picture: Three Dimensional Characterization of Unmodified and Sr‐Modified Al‐Si Eutectics by FIB and FIB EDX Tomography (Adv. Eng. Mater. 8/2006)
Author(s) -
Lasagni F.,
Lasagni A.,
Holzapfel C.,
Mücklich F.,
Degischer H. P.
Publication year - 2006
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200690016
Subject(s) - materials science , eutectic system , focused ion beam , characterization (materials science) , energy dispersive x ray spectroscopy , morphology (biology) , alloy , cover (algebra) , analytical chemistry (journal) , chemical engineering , nanotechnology , metallurgy , ion , composite material , scanning electron microscope , chromatography , mechanical engineering , physics , quantum mechanics , biology , chemistry , engineering , genetics
The cover shows the 3D‐morphology of the eutectic Si phase in an unmodified AlSi12‐alloy. These 3D‐structures were reconstructed by means of a new Focused Ion Beam Energy Dispersive Spectroscopy (FIB‐EDX) method. More about the study of the three‐dimensional morphology of different eutectic architectures of unmodified and Sr‐modified AlSi‐alloys can be found in the article by F. Lasagni et al. on page 719.