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Nanocrystallized Al 92 Sm 8 Amorphous Alloy Investigated by High‐Resolution Microscopy and 3D Atom‐Probe Analysis
Author(s) -
Gloriant T.,
Danoix F.,
Lefebvre W.,
Greer A. L.
Publication year - 2007
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200600222
Subject(s) - atom probe , materials science , alloy , amorphous metal , nanostructure , amorphous solid , field ion microscope , atom (system on chip) , resolution (logic) , microscopy , crystallography , analytical chemistry (journal) , metallurgy , nanotechnology , ion , optics , chemistry , chromatography , physics , organic chemistry , artificial intelligence , embedded system , computer science
A partially nanocrystallized amorphous Al 92 Sm 8 (at.%) alloy was obtained directly by rapid solidification (one‐step method). Because of the significant retained plasticity of the as‐quenched alloy, the nanostructure and the atomic species distribution within the nanocomposite material could be characterized by field‐ion microscopy (FIM) and by three‐dimensional atom‐probe analysis (3DAP).