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Atom Probe Tomography II. The Precipitation in Al Base Alloys
Author(s) -
De Geuser F.,
Lefebvre W.,
Auger P.,
Danoix F.,
Bigot A.,
Blavette D.
Publication year - 2006
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200600180
Subject(s) - atom probe , materials science , alloy , precipitation hardening , precipitation , atom (system on chip) , crystallography , duplex (building) , hardening (computing) , metallurgy , composite material , chemistry , dna , biochemistry , physics , layer (electronics) , meteorology , computer science , embedded system
This paper presents two illustrations of the study of phase separation in Al‐based alloys by means of tomographic atom probe. In an AlMgSi alloy, calculations of pair correlation functions have revealed that the nature of solute short range order differs from a pre‐aged specimen to a non‐pre‐aged specimen. This results in different responses to aged hardening treatments. Concerning Al 3 (Zr,Sc)‐type dispersoids observed in another Al‐based alloy, they are found to display a core‐shell structure wherein Zr is mainly present in the dispersoids periphery. This duplex structure is likely to explain the relative stability of Al 3 (Zr,Sc) dispersoids.