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In‐Situ X‐ray Diffraction as a Tool to Probe Mechanical Phenomena Down to the Nano‐Scale
Author(s) -
Keckes J.,
Eiper E.,
Martinschitz K. J.,
Boesecke P.,
Gindl W.,
Dehm G.
Publication year - 2006
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200600156
Subject(s) - materials science , diffraction , in situ , synchrotron , x ray crystallography , composite material , nano , nanoindentation , nanoscopic scale , nanotechnology , optics , physics , meteorology
Several applications of laboratory and in‐situ synchrotron X‐ray diffraction (XRD) techniques to characterize mechanical phenomena in nano‐scale structures are presented. A size dependency of the flow stress in Al thin films is studied by non‐ambient XRD. Moreover, a recovery of the modulus of cyclically strained coir fibres is analysed by in‐situ XRD combined with mechanical tests.