In‐Situ X‐ray Diffraction as a Tool to Probe Mechanical Phenomena Down to the Nano‐Scale | Zendy

Keckes J. | Zendy; Eiper E. | Zendy; Martinschitz K. J. | Zendy; Boesecke P. | Zendy; Gindl W. | Zendy; Dehm G. | Zendy

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In‐Situ X‐ray Diffraction as a Tool to Probe Mechanical Phenomena Down to the Nano‐Scale

Author(s) -

Keckes J.,

Eiper E.,

Martinschitz K. J.,

Boesecke P.,

Gindl W.,

Dehm G.

Publication year - 2006

Publication title -

advanced engineering materials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.938

H-Index - 114

eISSN - 1527-2648

pISSN - 1438-1656

DOI - 10.1002/adem.200600156

Subject(s) - materials science , diffraction , in situ , synchrotron , x ray crystallography , composite material , nano , nanoindentation , nanoscopic scale , nanotechnology , optics , physics , meteorology

Several applications of laboratory and in‐situ synchrotron X‐ray diffraction (XRD) techniques to characterize mechanical phenomena in nano‐scale structures are presented. A size dependency of the flow stress in Al thin films is studied by non‐ambient XRD. Moreover, a recovery of the modulus of cyclically strained coir fibres is analysed by in‐situ XRD combined with mechanical tests.

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