Premium
Small‐Amplitude Atomic Force Microscopy
Author(s) -
Patil S. V.,
Hoffmann P. M.
Publication year - 2005
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200500054
Subject(s) - nanotribology , cantilever , nanoengineering , atomic units , atomic force microscopy , materials science , nanoindentation , nanomechanics , conductive atomic force microscopy , amplitude , kelvin probe force microscope , non contact atomic force microscopy , nanotechnology , atomic force acoustic microscopy , deflection (physics) , dissipation , molecular dynamics , magnetic force microscope , optics , physics , composite material , thermodynamics , quantum mechanics , magnetization , magnetic field
Small amplitude Atomic Force Microscopy (AFM) is a relatively new AFM technique which was specifically developed to perform linear measurements of nanomechanical phenomena. This is achieved by using ultra‐small cantilever amplitudes and very high sensitivity deflection sensors. Recently this technique has been used in ultra‐high vacuum (UHV) and liquid environments to measure atomic and molecular forces and dynamics with high precision. Here we focus on three examples which are interesting from a nanoengineering standpoint: Atomic energy dissipation (atomic friction), atomic‐scale contact mechanics, and nanotribology/molecular ordering in confined liquid films.