Premium
Formation of Al 4 Cu 9 on the 5 fold Surface of Icosahedral AlPdMn
Author(s) -
Bielmann M.,
Barranco A.,
Ruffieux P.,
Gröning O.,
Fasel R.,
Widmer R.,
Gröning P. A.
Publication year - 2005
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200500050
Subject(s) - icosahedral symmetry , quasicrystal , x ray photoelectron spectroscopy , materials science , diffraction , crystallography , electron diffraction , low energy electron diffraction , optics , chemistry , nuclear magnetic resonance , physics
The authors report about the formation of Al 4 Cu 9 from a thin Cu film evaporated on the five‐fold surface of icosahedral AlPdMn. By heating up to 350°C Al diffuses from the quasicrystal into the Cu film forming well crystalline Al 4 Cu 9 present in 5 domains rotated by 72° with respect to each other and exposed in the (110) surface. The investigation was performed using Low Energy Electron Diffraction, X‐ray Photoelectron Diffraction and X‐ray Photoelectron Spectroscopy giving information about long range order, local structure and chemical composition.