z-logo
Premium
Quantitative Elastic‐Property Measurements at the Nanoscale with Atomic Force Acoustic Microscopy
Author(s) -
Hurley D. C.,
KopycinskaMüller M.,
Kos A. B.,
Geiss R. H.
Publication year - 2005
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200500039
Subject(s) - materials science , nanoscopic scale , atomic force microscopy , nanomechanics , metrology , atomic force acoustic microscopy , nanotechnology , elastic modulus , resolution (logic) , nanoindentation , microscopy , property (philosophy) , composite material , optics , magnetic force microscope , computer science , physics , magnetization , quantum mechanics , artificial intelligence , magnetic field , philosophy , epistemology
We are developing metrology for rapid, quantitative assessment of elastic properties with nanoscale spatial resolution. Atomic force acoustic microscopy (AFAM) methods enable measurements of modulus at either a single point or as a map of local property variations. The information obtained furthers our understanding of nanopatterned surfaces, thin films, and nanoscale structures.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here