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TEM Investigation of Spherical Primary Si Particles in As‐Quenched Al 60 Si 40 Ribbons
Author(s) -
Zhao Z. K.,
Yao K. F.
Publication year - 2005
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200400161
Subject(s) - materials science , machinability , microstructure , transmission electron microscopy , phase (matter) , primary (astronomy) , metallurgy , silicon , morphology (biology) , composite material , nanotechnology , machining , organic chemistry , astronomy , biology , genetics , chemistry , physics
Al‐Si alloys with high Si content are attractive in engineering application, especially in automobile industry. Their mechanical properties and machinability are quite sensitive to the morphology of the primary Si phase. In order to improve the mechanical properties of Al‐Si alloys, optimizing the shape and distribution of the primary Si are quite important. In this paper, the microstructure of the primary Si in the Al 60 Si 40 alloys prepared by rapid solidification method has been studied used the transmission electron microscope (TEM).