Open AccessAppendix 12: X‐Ray Diffraction Analysis of Thin‐Film Residual Stresses
Author(s) -
Éric Le Bourhis
Publication year - 2007
Publication title -
glass
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.1002/9783527617029.app12
Subject(s) - residual stress , diffraction , materials science , x ray crystallography , thin film , optics , composite material , crystallography , physics , chemistry , nanotechnology
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