Appendix C: Elements of Reliability Evaluation
Author(s) -
Wenyuan Li
Publication year - 2011
Language(s) - English
Resource type - Book series
DOI - 10.1002/9780470932117.app3
Subject(s) - reliability (semiconductor) , reliability engineering , appendix , fuzzy logic , computer science , data mining , engineering , artificial intelligence , geology , physics , quantum mechanics , paleontology , power (physics)
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom