Open AccessB: Introduction to Reliability Analysis
Author(s) -
Terje Aven
Publication year - 2008
Publication title -
risk analysis
Language(s) - Uncategorized
Resource type - Reports
eISSN - 1539-6924
pISSN - 0272-4332
DOI - 10.1002/9780470694435.app2
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , engineering , physics , quantum mechanics , power (physics)
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