Open AccessAppendix B: Prediction of ESD Damage Level for a Semiconductor Junction
Author(s) -
Michel Mardiguian
Publication year - 2009
Publication title -
john wiley and sons, inc. ebooks
Language(s) - English
Resource type - Book series
DOI - 10.1002/9780470495070.app2
Subject(s) - electrostatic discharge , michel foucault , citation , semiconductor , engineering , electrical engineering , art history , engineering physics , art , library science , computer science , law , political science , politics , voltage
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