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The recrystallized grain size piezometer for quartz: An EBSD‐based calibration
Author(s) -
Cross A. J.,
Prior D. J.,
Stipp M.,
Kidder S.
Publication year - 2017
Publication title -
geophysical research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.007
H-Index - 273
eISSN - 1944-8007
pISSN - 0094-8276
DOI - 10.1002/2017gl073836
Subject(s) - piezometer , electron backscatter diffraction , quartz , grain size , materials science , geology , mineralogy , microstructure , composite material , aquifer , geotechnical engineering , groundwater
We have reanalyzed samples previously used for a quartz recrystallized grain size paleopiezometer, using electron backscatter diffraction (EBSD). Recrystallized and relict grains are separated using their grain orientation spread, which acts as a measure of intragranular lattice distortion and a proxy for dislocation density. For EBSD maps made with a 1 μm step size, the piezometer relationship is D  = 10 3.91 ± 0.41  ∙  σ −1.41 ± 0.21 (for root‐mean‐square mean diameter values). We also present a “sliding resolution” piezometer relationship, D  = 10 4.22 ± 0.51  ∙  σ −1.59 ± 0.26 , that combines 1 μm step size data at coarser grain sizes with 200 nm step size data at finer grain sizes. The sliding resolution piezometer more accurately estimates stress in fine‐grained (<10 μm) samples. The two calibrations give results within 10% of each other for recrystallized grain sizes between 10 μm and 100 μm. Both piezometers match the original light optical microscopy quartz piezometer within error.

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