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X‐ray Diffraction Study of Thin Film Elastic Properties
Author(s) -
Villain P.,
Goudeau P.,
Renault P.O.,
Badawi K.F.
Publication year - 2002
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/1527-2648(20020806)4:8<554::aid-adem554>3.0.co;2-a
Subject(s) - materials science , diffraction , poisson's ratio , poisson distribution , young's modulus , elasticity (physics) , anisotropy , elastic modulus , composite material , thin film , modulus , ultimate tensile strength , x ray , optics , nanotechnology , mathematics , physics , statistics
Elasticity of reduced dimension materials remains misunderstood since both experimental and theoretical studies on this subject are difficult to perform. Numerous experiments realised in the early 90’s evidenced “elastic anomalies” in small period multilayer systems: “supermodulus”, breakdown of the Poisson’s effect. The authors now developed a method to study the elastic constants in thin films on substrates; it combines X‐ray diffraction and in situ tensile testing. This paper presents results on Poisson’s ratio measurement in elastically anisotropic films (Au) and gives the principles and experimental requirements for Young’s modulus determination.