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Electronic Speckle Pattern Interferometry for Micromechanical Measurements
Author(s) -
Tamulevičius S.,
Augulis L.,
Laukaitis G.,
Žadvydas M.
Publication year - 2002
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/1527-2648(20020806)4:8<546::aid-adem546>3.0.co;2-6
Subject(s) - electronic speckle pattern interferometry , speckle pattern , interferometry , specular reflection , materials science , speckle imaging , optics , displacement (psychology) , shearography , physics , psychology , psychotherapist
A new optical setup that could be used for the analysis of displacement (or strain) of objects with diffuse as well as mirror‐like reflecting (specular) surfaces is presented here together with the algorithm of data analysis. Combination of these two new approaches allows to minimize the area of analysis and to extend the class of materials to which the Electronic Speckle Pattern Interferometry (ESPI) can be applied.