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Recent Developments in Small‐Angle X‐Ray Scattering for the Study of Metals and Polymers
Author(s) -
Deschamps A.,
David L.,
Nicolas M.,
Bley F.,
Livet F.,
Séguéla R.,
Simon J.P.,
Vigier G.,
Werenskiold J. C.
Publication year - 2001
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/1527-2648(200108)3:8<579::aid-adem579>3.0.co;2-r
Subject(s) - materials science , thermosetting polymer , polymer , epoxy , scattering , hardening (computing) , nucleation , polymerization , composite material , curing (chemistry) , optics , thermodynamics , physics , layer (electronics)
New applications of Small‐Angle X‐ray Scattering in Materials Science of metallic alloys and polymers are presented. The use of powerful X‐ray sources like synchrotrons is shown to enable in‐situ study of dynamic system changes. Examples are given in welding of precipitation hardening aluminium alloys, where precipitate microstructures in welded structures are studied with high resolution and simulated through non‐isothermal heat treatments. The interest of in situ measurements is also shown for polymeric systems. Demixion phenomena occuring in the DGEBA/MCDEA/PEI modified thermoset system far from the critical concentration is studied during the curing of the epoxy‐amide polymerization. A methodology showing evidence of a nucleation/growth mechanism is presented. In addition, scattering measurements during deformation of polyethylenes is shown to yield the density of tie molecules, that are in direct relation to their long term properties.