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On the Application of X‐ray Microtomography in the Field of Materials Science
Author(s) -
Maire E.,
Buffière J. Y.,
Salvo L.,
Blandin J. J.,
Ludwig W.,
Létang J. M.
Publication year - 2001
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/1527-2648(200108)3:8<539::aid-adem539>3.0.co;2-6
Subject(s) - materials science , synchrotron radiation , synchrotron , microstructure , resolution (logic) , matrix (chemical analysis) , aluminium , characterization (materials science) , x ray microtomography , composite material , high resolution , optics , nanotechnology , computer science , physics , remote sensing , artificial intelligence , geology
The principle of the tomography technique and the different possible set‐ups, which can be used to obtain medium‐(10 μm) and high‐(1 μm) resolution, three‐dimensional, non‐destructive images, are shown in this paper. Illustrations are made of the applications of the technique in the field of materials science. Examples are given for medium‐resolution images of metallic foams and model metal matrix composites that are reinforced with spherical particles. High‐resolution examples are shown for aluminium alloys. For low‐absorbent materials we show that the phase contrast obtained using synchrotron radiation can provide a valuable solution. The quantitative use of these images, coupled with in‐situ tensile tests or used for the simple analysis of the initial microstructure of several structural materials, is also described.