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Application of Amorphous Silicon Thin‐Film Position‐Sensitive Detector to Optical Rules
Author(s) -
Martins R.,
Teodoro P.,
Soares F.,
Ferreira I.,
Guimarães N.,
Fortunato E.,
Borges J.,
José G.,
Groth A.,
Schultze L.,
Berndt D.,
Reichel F.,
Stam F.
Publication year - 2001
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/1527-2648(200103)3:3<174::aid-adem174>3.0.co;2-#
Subject(s) - materials science , amorphous silicon , silicon , thin film , detector , amorphous solid , optoelectronics , position (finance) , nanotechnology , optics , crystalline silicon , crystallography , physics , business , chemistry , finance
No abstracts