Premium
Surface analytical and electrochemical study on the role of adsorbed chloride ions in corrosion of stainless steels
Author(s) -
Rossi A.,
Tulifero R.,
Elsener B.
Publication year - 2001
Publication title -
materials and corrosion
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.487
H-Index - 55
eISSN - 1521-4176
pISSN - 0947-5117
DOI - 10.1002/1521-4176(200103)52:3<175::aid-maco175>3.0.co;2-s
Subject(s) - x ray photoelectron spectroscopy , chloride , chromium , electrochemistry , adsorption , hydroxide , sulfur , pitting corrosion , alloy , ion , corrosion , materials science , chemistry , inorganic chemistry , metallurgy , nuclear chemistry , electrode , chemical engineering , organic chemistry , engineering
The pitting potential E pit of 18/8 CrNi stainless steels with different sulfur content (0.003, 0.017 and 0.29%) has been determined from potentiodynamic polarization curves in deaerated neutral solutions (0.1 M NaCl and 1 M Na 2 SO 4 + 0.1 M NaCl) with nominally identical chloride content. E pit decreased with increasing sulfur content of the alloy and was about 0.2 V more negative in pure 0.1 M NaCl solution. The chemical composition of the passive film and the adsorbed chloride content have been determined by XPS surface analysis on mechanically polished samples passivated for one hour at potentials below the pitting potential. XPS results show that the surface films are composed in all cases of mixed iron‐chromium oxi‐hydroxides with a higher chromium content than the bulk composition. The average passive film composition (ca. 40% chromium oxi‐hydroxide) and the film thickness (2.3 ± 0.2 nm) were similar for all 18/8 CrNi steels regardless the different sulfur content. The amount of chlorides in the passive film is about twice as high on steels exposed to pure 0.1 N NaCl solution compared to the mixed 1 M Na 2 SO 4 + 0.1 M NaCl solution. Thus the lower pitting potential measured in pure 0.1 N NaCl solution correlates with the higher amount of chloride ions on the passive film surface.