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Sieve Calibration – a New Simple but High Precision Approach
Author(s) -
Rideal Graham R.,
Storey Jamie,
Morris Thomas R.
Publication year - 2000
Publication title -
particle and particle systems characterization
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.877
H-Index - 56
eISSN - 1521-4117
pISSN - 0934-0866
DOI - 10.1002/1521-4117(200006)17:2<77::aid-ppsc77>3.0.co;2-r
Subject(s) - sieve (category theory) , calibration , sieve analysis , aperture (computer memory) , significant difference , mean difference , optics , materials science , mathematics , statistics , physics , nanotechnology , acoustics , confidence interval , combinatorics
This paper describes the preparation, measurement and use of microspheres for calibrating individual test sieves. Using a 63 µm sieve as an example, 2.5 million apertures, or 80% of the surface is examined in under 2 minutes. Because of the narrowness of the size distribution, a 5% difference in percent passing only results in a mean aperture difference of 1 µm, indeed, the measurement uncertainty for all 24 tests performed was only 0.7 µm. The calibration is independent of the method of shaking and can be used for most sieves.