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Voltohmmetry as an Alternative Detection Method at Polycrystalline Metal Film Electrodes
Author(s) -
Emons Hendrik,
Glück Olaf,
Hüllenkremer Bettina,
Schöning Michael J.
Publication year - 2001
Publication title -
electroanalysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.574
H-Index - 128
eISSN - 1521-4109
pISSN - 1040-0397
DOI - 10.1002/1521-4109(200105)13:8/9<677::aid-elan677>3.0.co;2-w
Subject(s) - electrode , materials science , dissolution , thin film , deposition (geology) , analyte , crystallite , noble metal , metal , optoelectronics , nanotechnology , analytical chemistry (journal) , chemical engineering , chemistry , metallurgy , chromatography , paleontology , sediment , engineering , biology
A new method is introduced for the detection of dissolved analytes which can be deposited at noble metal electrodes. It is based on the measurement of surface resistance‐potential curves at thin‐film electrodes and has been named voltohmmetry. The measuring principle, fundamental prerequisites and the necessary experimental set‐up are described. As an example the deposition and dissolution of lead has been studied by cyclic voltohmmetric experiments at specifically prepared thin‐film gold electrodes. The present possibilities and limitations of surface resistance‐potential measurements for electroanalysis are discussed.

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