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Approaching Nanoxerography: The Use of Electrostatic Forces to Position Nanoparticles with 100 nm Scale Resolution
Author(s) -
Jacobs H.O.,
Campbell S.A.,
Steward M.G.
Publication year - 2002
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/1521-4095(20021104)14:21<1553::aid-adma1553>3.0.co;2-9
Subject(s) - materials science , nanoparticle , nanotechnology , suspension (topology) , charge (physics) , resolution (logic) , phase (matter) , aerosol , physics , organic chemistry , computer science , chemistry , quantum mechanics , artificial intelligence , mathematics , homotopy , pure mathematics
Nanoparticles have been self‐assembled using a novel technique described as nanoxerography (see cover). A method has been developed by the authors to pattern charge with 100 nm resolution. These charge patterns act as “receptors” for nanoparticles (see Figure), enabling the directed self‐assembly of nanoparticles from a powder, gas phase (aerosol), and liquid phase (suspension).