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The Effect of Keto Defect Sites on the Emission Properties of Polyfluorene‐Type Materials
Author(s) -
List E.J.W.,
Guentner R.,
Scanducci de Freitas P.,
Scherf U.
Publication year - 2002
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/1521-4095(20020304)14:5<374::aid-adma374>3.0.co;2-u
Subject(s) - polyfluorene , materials science , fluorenone , degradation (telecommunications) , photochemistry , nanotechnology , optoelectronics , fluorene , polymer , conjugated system , composite material , telecommunications , chemistry , computer science
Keto defect sites play a key role as the source of low‐energy emission bands in polyfluorene type materials. The formation of fluorenone defect sites can be regarded as a dominant degradation mechanism in light‐emitting devices based on polyfluorenes. The superiority of difunctionalization (see Figure) at the methylene group in –CR 2 – bridged polyphenylene and polyarylene derivatives is illustrated.