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Ellipsometric Determination of Anisotropic Optical Constants in Electroluminescent Conjugated Polymers
Author(s) -
Ramsdale C.M.,
Greenham N.C.
Publication year - 2002
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/1521-4095(20020205)14:3<212::aid-adma212>3.0.co;2-v
Subject(s) - materials science , ellipsometry , polymer , electroluminescence , conjugated system , optoelectronics , optics , photodiode , reflection (computer programming) , oled , light emitting diode , anisotropy , diode , thin film , nanotechnology , composite material , physics , layer (electronics) , computer science , programming language
Structural information about the degree of chain alignment in thin polymer films can be obtained by ellipsometry. A combination of reflection and transmission ellipsometry has been employed to determine the ordinary and extraordinary optical constants in conjugated polymer films in both the absorbing and transparent regions. Optical constants obtained by this technique will allow accurate modeling of the optical structure of polymer light‐emitting diodes (LEDs) and photodiodes.