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Measurement of the Anisotropic Refractive Indices of Spin Cast Thin Poly(2‐methoxy‐5‐(2′‐ethyl‐hexyloxy)‐ p ‐phenylenevinylene) (MEH–PPV) Films
Author(s) -
Tammer M.,
Monkman A.P.
Publication year - 2002
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/1521-4095(20020205)14:3<210::aid-adma210>3.0.co;2-2
Subject(s) - materials science , refractive index , ellipsometry , thin film , anisotropy , dielectric function , dispersion (optics) , dielectric , optics , electroluminescence , range (aeronautics) , analytical chemistry (journal) , condensed matter physics , optoelectronics , composite material , organic chemistry , nanotechnology , physics , chemistry , layer (electronics)
Variable angle spectroscopic ellipsometry measurements (see Figure for principle) show that thin spin‐cast films of MEH–PPV are highly anisotropic. Accurate dispersion data for the refractive index and the dielectric function of MEH–PPV in the energy range 1.24 to 5.00 eV are also given.