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Attaching Silica Nanoparticles from Suspension onto Surface Charge Patterns Generated by a Conductive Atomic Force Microscope Tip
Author(s) -
Mesquida P.,
Stemmer A.
Publication year - 2001
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/1521-4095(200109)13:18<1395::aid-adma1395>3.0.co;2-0
Subject(s) - materials science , nanotechnology , suspension (topology) , conductive atomic force microscopy , nanoparticle , atomic force microscopy , electrical conductor , surface charge , electrostatic force microscope , chemical engineering , composite material , chemistry , mathematics , homotopy , pure mathematics , engineering
A conductive atomic force microscope (AFM) tip acts as a nanopencil to write positive or negative charge patterns into a fluorocarbon film. Silica nanobeads (with a positive surface charge) can be attached to negative patterns by Coulombic interaction. While the resolution of the writing process is up to 100 nm, coagulation of the silica beads makes 1 μm a realistic minimum width for structures thus formed (see Figure and also cover).