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Recording at the Nanometer Scale on p ‐Nitrobenzonitrile Thin Films by Scanning Tunneling Microscopy
Author(s) -
Shi D. X.,
Song Y. L.,
Zhu D. B.,
Zhang H. X.,
Xie S. S.,
Pang S. J.,
Gao H.J.
Publication year - 2001
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/1521-4095(200107)13:14<1103::aid-adma1103>3.0.co;2-b
Subject(s) - scanning tunneling microscope , nanometre , materials science , scanning probe microscopy , thin film , microscopy , nanotechnology , quantum tunnelling , scanning ion conductance microscopy , electrochemical scanning tunneling microscope , scanning tunneling spectroscopy , scale (ratio) , optics , analytical chemistry (journal) , optoelectronics , scanning confocal electron microscopy , scanning electron microscope , composite material , physics , chemistry , chromatography , quantum mechanics
A data storage density of at least 10 14 bits/cm 2 is possible using p ‐nitrobenzonitrile as the data storage medium and scanning tunneling microscopy (STM) as the recording method. This represents the smallest mark size among all the organic thin films studied by these authors. The Figure shows a typical STM image of a recorded pattern.