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Probing Solid–Solution Interfacial Chemistry with ATR‐IR Spectroscopy of Particle Films
Author(s) -
McQuillan A. J.
Publication year - 2001
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/1521-4095(200107)13:12/13<1034::aid-adma1034>3.0.co;2-7
Subject(s) - attenuated total reflection , materials science , adsorption , spectroscopy , infrared spectroscopy , particle (ecology) , biocompatibility , photocatalysis , solid surface , infrared , chemical engineering , thin film , nanotechnology , optics , chemistry , catalysis , organic chemistry , chemical physics , physics , oceanography , quantum mechanics , engineering , geology , metallurgy
Infrared (IR) spectroscopy of thin particle films, deposited on an attenuated total reflection (ATR) crystal and immersed in solution, has high potential for investigating the chemistry of solid–solution interfaces. Phenomena that can be studied include pH‐dependent adsorption, photosensitization, photocatalysis, and biocompatibility of prosthetic materials. With films a few micrometers thick, the penetration depth of the evanescent IR wave is sufficient to monitor surface reactions throughout the high surface area particle film.