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Direct Visualization of the Nanoscale Morphology of Conducting Polythiophene Monolayers Studied by Electrostatic Force Microscopy
Author(s) -
Hassenkam T.,
Greve D. R.,
Bjørnholm T.
Publication year - 2001
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/1521-4095(200105)13:9<631::aid-adma631>3.0.co;2-f
Subject(s) - polythiophene , materials science , nanometre , nanoscopic scale , monolayer , conductive polymer , nanotechnology , electrostatic force microscope , morphology (biology) , microscopy , conductive atomic force microscopy , atomic force microscopy , polymer , optics , composite material , physics , biology , genetics
The relation between electronic properties and morphology of conducting polymers has been a central issue since the very beginning of the field. The present paper provides the first direct visualization of highly conducting domains extending over hundreds of nanometers (see cover) in a conductive polythiophene thin film fabricated by the Langmuir–Schaefer technique and studied by electrostatic force microscopy (principle shown in Figure).

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