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Isothermal and Isochronal Studies of the Structural and Electrical Properties of CdTe
Author(s) -
AlDhafiri A. M.
Publication year - 2002
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/1521-4079(200209)37:9<950::aid-crat950>3.0.co;2-a
Subject(s) - annealing (glass) , materials science , isothermal process , cadmium telluride photovoltaics , electrical resistance and conductance , sheet resistance , metallurgy , composite material , thermodynamics , optoelectronics , physics , layer (electronics)
Cadmium telluride (CdTe) thin films were grown by thermal evaporation technique. The influence of post‐growth heat treatment, isothermal and isochronal, on the structural and electrical properties of these films were carried out. Multi phases were obtained as a function of the period and the value of annealing temperature. In isothermal annealing, the sheet resistance was dropped by many orders while in isochronal annealing it was increased fairly. A correlation between the temperature and the annealing time and the structural characteristics of these films was established in both type of annealing. The grain size and the sheet resistance were found greatly affected by the type of annealing as well as the temperature and the annealing time.