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Asymmetric Bragg Reflection as Magnifying Optics
Author(s) -
Köhler R.,
Schäfer P.
Publication year - 2002
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/1521-4079(200207)37:7<734::aid-crat734>3.0.co;2-i
Subject(s) - optics , magnification , synchrotron radiation , bragg's law , diffraction , reflection (computer programming) , image resolution , resolution (logic) , micrometer , physics , synchrotron , fresnel diffraction , x ray optics , fresnel zone , x ray , computer science , artificial intelligence , programming language
Usually about one micrometer is considered the lower limit of spatial resolution (in direct space) of x‐ray diffraction. This is due as well to diffraction as to image detection. The latter problem can be addressed by image magnification. There are several efforts to achieve image magnification. One is magnification by asymmetric Bragg reflection. This is well known for many years. In the present paper the implications regarding experimental set‐up, resolution and efficiency will be considered from the experimental point of view. High magnification at good spatial resolution requires synchrotron radiation. Experiments were performed at beamlines ID19 and ID11 of the European Synchrotron Radiation Facility (ESRF). It is shown that actually a spatial resolution considerable better than one micrometer can be achieved. There are, however, some drawbacks which are related to source characteristics, synchrotron beam optics, Fresnel and Bragg diffraction.