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Observation of Edge Diffraction with a Double Crystal Diffractometer
Author(s) -
Treimer W.,
Strobl M.,
Hilger A.
Publication year - 2002
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/1521-4079(200207)37:7<727::aid-crat727>3.0.co;2-a
Subject(s) - diffraction , diffractometer , scattering , crystal (programming language) , optics , fresnel diffraction , intensity (physics) , materials science , x ray crystallography , enhanced data rates for gsm evolution , crystallography , physics , molecular physics , chemistry , scanning electron microscope , telecommunications , computer science , programming language
We have observed edge diffraction with a double crystal diffractometer and therefore can explain the enhanced wing intensity of measured Darwin profiles in dynamical diffraction. Precise experiments uniquely demonstrate the contribution of Fresnel diffraction at absorbing straight edges, interpreted as ultra small angle scattering (USAS) or diffuse scattering in other experiments. No contributions were found due to ultra small surface scattering or TDS stemming from the crystals, which was proposed by other groups to explain the enhanced wing intensity of their measured rocking curves.