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Structural Properties of InSbBi and InSbAsBi Thin Films Prepared by the Flash‐Evaporation Method
Author(s) -
Oszwaldowski M.,
Berus T.,
Szade J.,
Józwiak K.,
Olejniczak I.,
Konarski P.
Publication year - 2001
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/1521-4079(200110)36:8/10<1155::aid-crat1155>3.0.co;2-c
Subject(s) - flash evaporation , evaporation , thin film , flash (photography) , materials science , chemical engineering , composite material , nanotechnology , chemistry , optics , chromatography , physics , thermodynamics , engineering
Thin films of InSbBi and InSbAsBi were obtained for the first time by the flash‐evaporation method using a mixture of powders of InSb, InBi and InAs. The structure and the composition of the films were investigated by XRD, SEM coupled with an X‐ray microprobe, XPS and SIMS. The energy band‐gap was determined from the optical transmittance and the temperature dependence of the Hall coefficient. It was found that the maximum concentration of Bi on the substitutional sites in the films is about 1 at.%. This concentration is independent of the As concentration. The incorporation of Bi and As decreases the energy band‐gap to 0.1 eV. The obtained films have a number of inclusions composed mainly of InBiSb alloys. This work demonstrates the applicability of the flash evaporation method for obtaining the mixed crystal films having parameters useful for the applications in optoelectronics.