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Stresses and Strains in Anisotropic Cubic Ultra‐Thin Overlayers
Author(s) -
Kunert H. W.,
Lavitska E.
Publication year - 2001
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/1521-4079(200110)36:8/10<1045::aid-crat1045>3.0.co;2-k
Subject(s) - overlayer , isotropy , materials science , anisotropy , condensed matter physics , thin film , stiffness , crystallography , physics , chemistry , optics , nanotechnology , composite material
The following quantities have been calculated for anisotropic overlayers of cubic crystals: (i) a set of useful stiffness constant transformation relations together with error probes i.e. equations for checking the correctness of the transformed quantities when reduced to isotropic medium, (ii) the transformed stiffness constants, (iii) Hookian relation and strain energy density for fcc {111} ultra‐thin overlayer. A direct application of the calculated quantities to Si {111} overlayer is also discussed.