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X‐ray Rotation‐Tilt‐Method — First Results of a new X‐ray Diffraction Technique
Author(s) -
Bauch J.,
Ullrich H.J.,
Reiche D.
Publication year - 2000
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/1521-4079(200004)35:4<473::aid-crat473>3.0.co;2-1
Subject(s) - tilt (camera) , realization (probability) , rotation (mathematics) , diffraction , x ray , optics , physics , x ray crystallography , computer science , mathematics , geometry , computer vision , statistics
That from us as X‐ray Rotation‐Tilt Technique (XRT Method) designated procedure principle represents a world innovation and overcomes essential disadvantages of comparable diffraction techniques known up to now. Starting from the origin and the informational content of the XRT interferences a realization of a special equipment and selected examples of some first applications are presented.