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Estimation and Correction of Effects of Simultaneous Reflections on Intensity Data Collected with the Four‐Circle Diffractometer
Author(s) -
Sawada H.
Publication year - 2000
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/1521-4079(200003)35:3<307::aid-crat307>3.0.co;2-l
Subject(s) - diffractometer , intensity (physics) , optics , computational physics , physics , materials science , scanning electron microscope
A procedure based on the kinematical theory has been developed to estimate and correct the effects of simultaneous reflections on intensity data collected with the four‐circle single crystal X‐ray diffractometer through minimizing the scatter of the corrected structure factor (intensity) values of equivalent reflections.