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Probe Measurements on Parametric Decay and Density Threshold in a Linear Microwave Discharge
Author(s) -
Wolters U.,
Meyer D.,
Wiesemann K.
Publication year - 2001
Publication title -
contributions to plasma physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.531
H-Index - 47
eISSN - 1521-3986
pISSN - 0863-1042
DOI - 10.1002/1521-3986(200109)41:5<524::aid-ctpp524>3.0.co;2-k
Subject(s) - microwave , langmuir probe , plasma , atomic physics , materials science , parametric statistics , antenna (radio) , noise (video) , plasma diagnostics , plasma parameters , computational physics , physics , nuclear physics , telecommunications , statistics , mathematics , quantum mechanics , artificial intelligence , computer science , image (mathematics)
Flat Langmuir probes, a flush mounted probe and an insulated antenna were used to investigate the correlation between the plasma density and the occurrence of radio frequency‐ and X‐band‐noise as a fingerprint for parametric decay processes in a magnetized linear plasma device. The decay products of the driving microwave may influence the entire scenario of electron and ion heating in the plasma.