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Spectral Line He II 6560 Å as a Sensor of the Electron Concentration in a Dense Plasma of a Current Sheet
Author(s) -
Frank A.G.,
Gavrilenko V.P.,
Kyrie N.P.,
Markov V.S.
Publication year - 2001
Publication title -
contributions to plasma physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.531
H-Index - 47
eISSN - 1521-3986
pISSN - 0863-1042
DOI - 10.1002/1521-3986(200101)41:1<85::aid-ctpp85>3.0.co;2-o
Subject(s) - plasma , line (geometry) , current (fluid) , electron , blueshift , materials science , spectral line , atomic physics , physics , optics , optoelectronics , quantum mechanics , photoluminescence , geometry , mathematics , thermodynamics
Stark broadening of the spectral line He II 6560 Å by plasma was studied. The profiles of the line He II 6560 Å were calculated for different values of the electron concentration N e . We used the quasi‐static approximation to account for the perturbing ions and the impact approximation to describe the perturbing electrons. The electron concentration N e in the central region of a current sheet plasma was deduced by comparing the experimentally obtained profiles of the line He II 6560 Å with the set of the theoretically calculated profiles of this line.