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Raman Spectroscopy as a Tool for Characterization of Strained Hexagonal GaN/Al x Ga 1— x N Superlattices
Author(s) -
Davydov V.Yu.,
Smirnov A.N.,
Goncharuk I.N.,
Kyutt R.N.,
Scheglov M.P.,
Baidakova M.V.,
Lundin W.V.,
Zavarin E.E.,
Smirnov M.B.,
Karpov S.V.,
Harima H.
Publication year - 2002
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(200212)234:3<975::aid-pssb975>3.0.co;2-l
Subject(s) - superlattice , raman spectroscopy , materials science , raman scattering , hexagonal crystal system , strain (injury) , characterization (materials science) , alloy , spectroscopy , layer (electronics) , optoelectronics , optics , crystallography , chemistry , nanotechnology , metallurgy , physics , medicine , quantum mechanics
It is shown that such parameters of GaN/Al x Ga 1— x N superlattice as the period, built‐in strain, composition of the alloy, and individual layer thicknesses can be extracted from the energy positions, intensities, and line shapes of various optical and acoustic modes detected in Raman scattering.