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Voltage Induced Electrical Connectivity on a Percolation Cluster
Author(s) -
Shimoni N.,
Azulay D.,
Balberg I.,
Millo O.
Publication year - 2002
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(200203)230:1<143::aid-pssb143>3.0.co;2-7
Subject(s) - percolation (cognitive psychology) , cluster (spacecraft) , percolation threshold , voltage , materials science , condensed matter physics , percolation theory , statistical physics , electrical resistivity and conductivity , physics , topology (electrical circuits) , computer science , mathematics , combinatorics , neuroscience , psychology , quantum mechanics , programming language
Considering the very recent interest in the flow between two sites on a percolation cluster it is obvious that an experimental study of such a problem requires local measurement techniques. Following this observation we report the first study of the voltage dependence of the images derived by contact‐resistance atomic force microscopy (C‐AFM) in general, and on a binary composite in particular. The results obtained provide an experimental map of the voltage dependence of the realized connectivity between a given pair of sites on a percolation cluster. Our measurements show that the two‐dimensional cross‐section images of a three‐dimensional percolation cluster reveal a systematic behavior that can be described as a phase transition.