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1/ f Noise and Hot Electron Effects in Variable Range Hopping Conduction
Author(s) -
McCammon D.,
Galeazzi M.,
Liu D.,
Sanders W.T.,
Smith B.,
Tan P.,
Boyce K.R.,
Brekosky R.,
Gygax J.D.,
Kelley R.,
Mott D.B.,
Porter F.S.,
Stahle C.K.,
Stahle C.M.,
Szymkowiak A.E.
Publication year - 2002
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(200203)230:1<1::aid-pssb1>3.0.co;2-z
Subject(s) - variable range hopping , condensed matter physics , thermistor , thermal conduction , physics , doping , semiconductor , noise (video) , electron , cover (algebra) , engineering physics , materials science , optoelectronics , thermodynamics , engineering , nuclear physics , quantum mechanics , computer science , artificial intelligence , image (mathematics) , mechanical engineering
Abstract Dan McCammon is Professor for Space Physics in the Astrophysics group at the University of Wisconsin‐Madison, where he is working on the development of microcalorimeters as detectors for astronomical X‐ray spectroscopy. The paper [1], performed in a collaboration with NASA and featured as Editor's Choice in this issue of phys. stat. sol. (b), characterizes hopping‐related effects in semiconductor thermometers used with these detectors, operating at temperatures near 50 mK. The cover picture depicts a simple hot electron model, similarly to well‐established effects in metals, which can explain the observed electrical nonlinearities and power‐law behavior of the thermal conductivity in doped Si and Ge thermistors. The paper is an invited presentation and part of the Proceedings of the 9th International Conference on Hopping and Related Phenomena (HRP‐9) which took place in Shefayim, Israel, September 3–6, 2001.