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Near/Far‐Field Investigations of the Interaction between Surface Waves and Nanoparticles
Author(s) -
Sterligov V.A.,
Cheyssac P.,
Kofman R.,
Lysenko S.I.,
Lytvyn P.M.,
Vohnsen B.,
Bozhevolnyi S.I.,
Maradudin A.A.
Publication year - 2002
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(200202)229:3<1283::aid-pssb1283>3.0.co;2-o
Subject(s) - near and far field , near field scanning optical microscope , scattering , optics , materials science , intensity (physics) , electric field , field (mathematics) , electromagnetic field , optical microscope , nanoparticle , physics , nanotechnology , scanning electron microscope , mathematics , quantum mechanics , pure mathematics
Results of experimental studies of the scattering of electromagnetic surface waves by metal nanoparticles (NPs) located at different distances of a silver film and carried out by both near‐ and far‐field optical techniques are presented for the first time, as far as we know. SNOM and AFM techniques were applied to investigate near‐field scattering and topographical images of the outer interface. In the far‐field, the half‐space distribution of the normalized scattered light intensity has been measured and shows, as well as SNOM, an increase of the scattered intensity with NPs–silver distance. These results can be attributed to the variation of the space distribution of the electric field of the surface wave.