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CdZnTe:Cl Crystals for X‐Ray Computer Tomography Detectors
Author(s) -
Matveev O.A.,
Terentev A.I.,
Karpenko V.P.,
Zeleni.K.,
Fauler A.,
Fiederle M.,
Benz K.W.
Publication year - 2002
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(200201)229:2<1073::aid-pssb1073>3.0.co;2-3
Subject(s) - photocurrent , tomography , detector , x ray , materials science , afterglow , optics , crystallography , physics , optoelectronics , chemistry , astrophysics , gamma ray burst
Processes of growth of semi‐insulating Cd 1— x Zn x Te:Cl crystals ( x = 0.0002 and 0.1) of n‐type conductivity are investigated. From the grown crystals detectors for X‐ray computer tomography with small value of photocurrent memory (afterglow) (0.1–0.3%) are obtained.