Premium
Luminescent Properties of Blue‐Emitting SrS:Cu, F Thin‐Film EL Devices
Author(s) -
Nakanishi Y.,
Nakajima T.,
Kominami H.,
Ehara M.,
Hatanaka Y.
Publication year - 2002
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(200201)229:2<1011::aid-pssb1011>3.0.co;2-r
Subject(s) - electroluminescence , photoluminescence , materials science , phosphor , luminescence , thin film , analytical chemistry (journal) , annealing (glass) , optoelectronics , full width at half maximum , electron beam physical vapor deposition , blue laser , emission spectrum , fabrication , spectral line , layer (electronics) , diode , chemistry , nanotechnology , medicine , physics , alternative medicine , chromatography , astronomy , pathology , composite material
SrS:Cu,F thin‐film electroluminescent (TFEL) devices were prepared by electron beam evaporation and their luminescent properties were investigated. Photoluminescence (PL) spectra of SrS:Cu,F phosphors were measured under excitation with 325 nm of He–Cd laser at room temperature. It was shown that the PL spectra for Cu concentration of 0.3 at% showed a strong blue emission with the peak at about 470 nm. A standard double insulator structure was employed for EL device fabrication using Y 2 O 3 as first and second insulators, and ZnS was employed as buffer layer. TFEL devices prepared with rapid thermal annealing at 900 °C showed the same blue emission as the PL spectrum. The maximum luminance of 82 cd/m 2 and CIE coordinates of ( x = 0.13, y = 0.22) could be obtained for devices with Cu content of 0.3 at% driven by 1 kHz pulses.