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Measurements of the Linear Electro‐Optic Coefficients of ZnTe by RDS
Author(s) -
Mori T.,
Kumagai N.,
Yasuda T.,
Takai T.,
Chang J.H.,
Hanada T.,
Yao T.
Publication year - 2002
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(200201)229:1<605::aid-pssb605>3.0.co;2-s
Subject(s) - pockels effect , anisotropy , reflectivity , optics , materials science , enhanced data rates for gsm evolution , optoelectronics , physics , telecommunications , computer science , laser
Abstract The linear electro‐optic (LEO) or Pockels coefficient above the fundamental edge E 0 of ZnTe has not been determined yet as far as we know. In this work, we have measured the LEO coefficient of ZnTe in the absorbing region by reflectance difference or reflectance anisotropy spectroscopy (RDS or RAS), and we have obtained two remarkable peaks near the E 1 and E 1 + Δ 1 critical points.