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Spontaneous Ordering in Thin Polycrystalline Cd 1–x Zn x Te Films during Annealing
Author(s) -
Edelman F.,
Stolyarova S.,
Chack A.,
Zakharov N.,
Werner P.,
Beserman R.,
Weil R.,
Nemirovsky Y.
Publication year - 2002
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(200201)229:1<141::aid-pssb141>3.0.co;2-b
Subject(s) - crystallite , recrystallization (geology) , annealing (glass) , materials science , transmission electron microscopy , thin film , crystallography , crystal twinning , chemical vapor deposition , analytical chemistry (journal) , mineralogy , chemistry , composite material , microstructure , nanotechnology , paleontology , chromatography , biology
Polycrystalline films of Cd 1— x Zn x Te (0 < x < 1) of ≈0.1 μm thickness on glass substrates were grown by Metal Organic Chemical Vapor Deposition at 480 °C. X‐ray diffraction and transmission electron microscopy (TEM) methods were used for the film characterization. TEM in‐situ heating the Cd 1— x Zn x Te films in the range of 200 to 300 °C caused the following structure transformations: strong recrystallization, twinning, and partial decomposition. The self‐diffusion coefficient, as estimated by TEM in‐situ recrystallization monitoring at 300 °C was found to be on the order of 10 —8 cm 2 /s. A CuPt‐type superstructure grew spontaneously in the films during the film annealing.