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Near K‐Edge Absorption Spectra of III–V Nitrides
Author(s) -
Fukui K.,
Hirai R.,
Yamamoto A.,
Hirayama H.,
Aoyagi Y.,
Yamaguchi S.,
Amano H.,
Akasaki I.,
Tanaka S.
Publication year - 2001
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(200111)228:2<461::aid-pssb461>3.0.co;2-q
Subject(s) - ternary operation , materials science , absorption (acoustics) , wurtzite crystal structure , spectral line , absorption edge , absorption spectroscopy , nitride , analytical chemistry (journal) , extended x ray absorption fine structure , synchrotron radiation , nitrogen , molecular physics , optics , chemistry , optoelectronics , zinc , band gap , physics , organic chemistry , layer (electronics) , chromatography , astronomy , computer science , metallurgy , composite material , programming language
Nitrogen and aluminum near K‐edge absorption measurements of wurtzite AlN, GaN and InN, and their ternary compounds (AlGaN, InGaN and InAlN) at various molar fractions have been performed using synchrotron radiation. Using the linear polarization of synchrotron radiation, absorption measurements with different incident light angles were also performed. The spectral distribution of the nitrogen K absorption spectra clearly depends on both the incident light angles and the molar fractions of the samples. That of the aluminum K absorption spectra also shows the clear angle dependence, but it does not show the drastic molar dependence. Spectral shape comparisons among the various molar fractions, different incident angles and between the two ion sites are discussed. The numerical component analysis of the K absorption spectra is also presented.